Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers - researchr publication authors

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Jian Wei Cheng, Melanie Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge N. Demidenko. Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. In Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010. pages 360-366, IEEE Computer Society, 2010. [doi]

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