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An Adaptive Multiexposure Scheme for the Structured Light Profilometry of Highly Reflective Surfaces Using Complementary Binary Gray Code

Tianle Cheng, Long Qin, Yulong Li, Jialong Hou, Changyan Xiao. An Adaptive Multiexposure Scheme for the Structured Light Profilometry of Highly Reflective Surfaces Using Complementary Binary Gray Code. IEEE T. Instrumentation and Measurement, 73:1-12, 2024. [doi]

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