Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang. ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. on CAD of Integrated Circuits and Systems, 17(8):668-681, 1998. [doi]
@article{ChengRTRK98,
title = {ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips},
author = {Yi-Kan Cheng and Prasun Raha and Chin-Chi Teng and Elyse Rosenbaum and Sung-Mo Kang},
year = {1998},
doi = {10.1109/43.712099},
url = {http://doi.ieeecomputersociety.org/10.1109/43.712099},
tags = {reliability},
researchr = {https://researchr.org/publication/ChengRTRK98},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {17},
number = {8},
pages = {668-681},
}