Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images - researchr publication authors

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Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, Kar-Ann Toh. Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images. IEEE Trans. on Circuits and Systems, 65-II(12):1849-1853, 2018. [doi]

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