Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, Kar-Ann Toh. Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images. IEEE Trans. on Circuits and Systems, 65-II(12):1849-1853, 2018. [doi]
@article{ChengSLGT18,
title = {Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images},
author = {Deruo Cheng and Yiqiong Shi and Tong Lin and Bah-Hwee Gwee and Kar-Ann Toh},
year = {2018},
doi = {10.1109/TCSII.2018.2827044},
url = {https://doi.org/10.1109/TCSII.2018.2827044},
researchr = {https://researchr.org/publication/ChengSLGT18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {65-II},
number = {12},
pages = {1849-1853},
}