Nano-scaled transistor reliability characterization at nano-second regime - researchr publication authors

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Ran Cheng, Ying Sun, Yiming Qu, Wei Liu, Fanyu Liu, Jianfeng Gao, Nuo Xu, Bing Chen. Nano-scaled transistor reliability characterization at nano-second regime. Science in China Series F: Information Sciences, 64(10), 2021. [doi]

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