Ran Cheng, Ying Sun, Yiming Qu, Wei Liu, Fanyu Liu, Jianfeng Gao, Nuo Xu, Bing Chen. Nano-scaled transistor reliability characterization at nano-second regime. Science in China Series F: Information Sciences, 64(10), 2021. [doi]
@article{ChengSQLLGXC21,
title = {Nano-scaled transistor reliability characterization at nano-second regime},
author = {Ran Cheng and Ying Sun and Yiming Qu and Wei Liu and Fanyu Liu and Jianfeng Gao and Nuo Xu and Bing Chen},
year = {2021},
doi = {10.1007/s11432-020-3088-3},
url = {https://doi.org/10.1007/s11432-020-3088-3},
researchr = {https://researchr.org/publication/ChengSQLLGXC21},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {64},
number = {10},
}