Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects - researchr publication authors

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Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza. Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 367-376, IEEE, 2025. [doi]

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