Deruo Cheng, Yiqiong Shi, Yee-Yang Tee, Jingsi Song, Xue Wang, Bihan Wen, Bah-Hwee Gwee. Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards. In 5th IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2023, Hangzhou, China, June 11-13, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.