iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang. iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. In DAC. pages 548-551, 1996. [doi]

This author has not been identified. Look up 'Yi-Kan Cheng' in GoogleThis author has not been identified. Look up 'Chin-Chi Teng' in GoogleThis author has not been identified. Look up 'Abhijit Dharchoudhury' in GoogleThis author has not been identified. Look up 'Elyse Rosenbaum' in GoogleThis author has not been identified. Look up 'Sung-Mo Kang' in Google

runs on WebDSL