iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips

Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang. iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. In DAC. pages 548-551, 1996. [doi]

Abstract

Abstract is missing.