Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method - researchr publication authors

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Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao. Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 601-608, IEEE, 2022. [doi]

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