Mingyang Cheng, Chuqiao Xu, Junliang Wang, Wenjun Zhang 0005, Yaqin Zhou, Jie Zhang 0041. MicroCrack-Net: A Deep Neural Network With Outline Profile-Guided Feature Augmentation and Attention-Based Multiscale Fusion for MicroCrack Detection of Tantalum Capacitors. IEEE Trans. Aerospace and Electronic Systems, 58(6):5141-5152, 2022. [doi]
Abstract is missing.