Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Kin P. Cheung. Impact of ESD protection device trigger transient on the reliability of ultra-thin gate oxide. Microelectronics Reliability, 41(5):745-749, 2001. [doi]
Abstract is missing.