D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu. ATE for VLSI: What Challenges Lie Ahead?. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 318-319, IEEE Computer Society, 1997. [doi]
Abstract is missing.