Trace equivalence decision: negative tests and non-determinism

Vincent Cheval, Hubert Comon-Lundh, Stéphanie Delaune. Trace equivalence decision: negative tests and non-determinism. In Yan Chen, George Danezis, Vitaly Shmatikov, editors, Proceedings of the 18th ACM Conference on Computer and Communications Security, CCS 2011, Chicago, Illinois, USA, October 17-21, 2011. pages 321-330, ACM, 2011. [doi]

Abstract

Abstract is missing.