Fast Parallel Kriging-Based Stepwise Uncertainty Reduction With Application to the Identification of an Excursion Set

Clément Chevalier, Julien Bect, David Ginsbourger, Emmanuel Vázquez, Victor Picheny, Yann Richet. Fast Parallel Kriging-Based Stepwise Uncertainty Reduction With Application to the Identification of an Excursion Set. Technometrics, 56(4):455-465, 2014. [doi]

Abstract

Abstract is missing.