The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation

Xuan Chi, Yubo Wang, Fan Li, Yixiao Huang, Chenruiyuan Yu, Shiqiang Wu, Huiqing Wen, Jiangmin Gu, Ping Zhang, Wen Liu. The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation. In International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023. pages 148-151, IEEE, 2023. [doi]

@inproceedings{ChiWLHYWWGZL23,
  title = {The Investigation of Source Field Plate on the Performance of pGaN Gate Device and Dual-Gate Bidirectional Switch using TCAD Simulation},
  author = {Xuan Chi and Yubo Wang and Fan Li and Yixiao Huang and Chenruiyuan Yu and Shiqiang Wu and Huiqing Wen and Jiangmin Gu and Ping Zhang and Wen Liu},
  year = {2023},
  doi = {10.1109/ICICDT59917.2023.10332430},
  url = {https://doi.org/10.1109/ICICDT59917.2023.10332430},
  researchr = {https://researchr.org/publication/ChiWLHYWWGZL23},
  cites = {0},
  citedby = {0},
  pages = {148-151},
  booktitle = {International Conference on IC Design and Technology, ICICDT 2023, Tokyo, Japan, September 25-28, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-1931-6},
}