Te-Kuang Chiang. A new two-dimensional analytical subthreshold behavior model for short-channel tri-material gate-stack SOI MOSFET's. Microelectronics Reliability, 49(2):113-119, 2009. [doi]
@article{Chiang09-4,
title = {A new two-dimensional analytical subthreshold behavior model for short-channel tri-material gate-stack SOI MOSFET's},
author = {Te-Kuang Chiang},
year = {2009},
doi = {10.1016/j.microrel.2008.11.005},
url = {http://dx.doi.org/10.1016/j.microrel.2008.11.005},
researchr = {https://researchr.org/publication/Chiang09-4},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {2},
pages = {113-119},
}