H.-L. Chiang, R. A. Hadi, J. F. Wang, H.-C. Han, J.-J. Wu, H.-H. Hsieh, J.-J. Horng, W. S. Chou, B.-S. Lien, C. H. Chang, Y.-C. Chen, Y. H. Wang, T.-C. Chen, J. C. Liu, Y.-C. Liu, M.-H. Chiang, K.-H. Kao, B. Pulicherla, J. Cai, C. S. Chang, K. W. Su, K.-L. Cheng, T.-J. Yeh, Y.-C. Peng, C. Enz, M.-C. F. Chang, M. F. Chang, H.-S. P. Wong, I. P. Radu. How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{ChiangHWHWHHCLC23,
title = {How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology},
author = {H.-L. Chiang and R. A. Hadi and J. F. Wang and H.-C. Han and J.-J. Wu and H.-H. Hsieh and J.-J. Horng and W. S. Chou and B.-S. Lien and C. H. Chang and Y.-C. Chen and Y. H. Wang and T.-C. Chen and J. C. Liu and Y.-C. Liu and M.-H. Chiang and K.-H. Kao and B. Pulicherla and J. Cai and C. S. Chang and K. W. Su and K.-L. Cheng and T.-J. Yeh and Y.-C. Peng and C. Enz and M.-C. F. Chang and M. F. Chang and H.-S. P. Wong and I. P. Radu},
year = {2023},
doi = {10.23919/VLSITechnologyandCir57934.2023.10185325},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185325},
researchr = {https://researchr.org/publication/ChiangHWHWHHCLC23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
publisher = {IEEE},
isbn = {978-4-86348-806-9},
}