A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs

Vivek Chickermane, Patrick R. Gallagher Jr., James Sage, Paul Yuan, Krishna Chakravadhanula. A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]

Authors

Vivek Chickermane

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Patrick R. Gallagher Jr.

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James Sage

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Paul Yuan

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Krishna Chakravadhanula

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