Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman. Practical Aspects of Delay Testing for Nanometer Chips. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 470, IEEE Computer Society, 2005. [doi]
@inproceedings{ChickermaneKMU05,
title = {Practical Aspects of Delay Testing for Nanometer Chips},
author = {Vivek Chickermane and Brion L. Keller and Kevin McCauley and Anis Uzzaman},
year = {2005},
doi = {10.1109/ATS.2005.89},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.89},
tags = {testing},
researchr = {https://researchr.org/publication/ChickermaneKMU05},
cites = {0},
citedby = {0},
pages = {470},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}