Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses

Omar Chihani, L. Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard. Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectronics Reliability, 88:402-405, 2018. [doi]

Abstract

Abstract is missing.