Hsien-Chin Chiu, Chao-Hung Chen, Hsuan-Ling Kao, Feng-Tso Chien, Ping-Kuo Weng, Yan-Tang Gau, Hao-Wei Chuang. Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis. Microelectronics Reliability, 53(12):1897-1900, 2013. [doi]
Abstract is missing.