Y. W. Chiu, Y. C. Chan, S. M. Lui. Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects. Microelectronics Reliability, 42(12):1945-1951, 2002. [doi]
@article{ChiuCL02,
title = {Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects},
author = {Y. W. Chiu and Y. C. Chan and S. M. Lui},
year = {2002},
doi = {10.1016/S0026-2714(02)00097-5},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00097-5},
tags = {C++},
researchr = {https://researchr.org/publication/ChiuCL02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {12},
pages = {1945-1951},
}