Characterization of solder interfaces using laser flash metrology

Chia-Pin Chiu, James Maveety, Quan A. Tran. Characterization of solder interfaces using laser flash metrology. Microelectronics Reliability, 42(1):93-100, 2002. [doi]

Authors

Chia-Pin Chiu

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James Maveety

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Quan A. Tran

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