Chia-Pin Chiu, James Maveety, Quan A. Tran. Characterization of solder interfaces using laser flash metrology. Microelectronics Reliability, 42(1):93-100, 2002. [doi]
@article{ChiuMT02,
title = {Characterization of solder interfaces using laser flash metrology},
author = {Chia-Pin Chiu and James Maveety and Quan A. Tran},
year = {2002},
doi = {10.1016/S0026-2714(01)00129-9},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00129-9},
researchr = {https://researchr.org/publication/ChiuMT02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {1},
pages = {93-100},
}