Identification of process disturbance using SPC/EPC and neural networks

Chih-Chou Chiu, Yuehjen E. Shao, Tian-Shyug Lee, Ker-Ming Lee. Identification of process disturbance using SPC/EPC and neural networks. J. Intelligent Manufacturing, 14(3-4):379-388, 2003. [doi]

Abstract

Abstract is missing.