Exploiting Behavioral Information in Gate-Level ATPG

Silvia Chiusano, Fulvio Corno, Paolo Prinetto. Exploiting Behavioral Information in Gate-Level ATPG. J. Electronic Testing, 14(1-2):141-148, 1999. [doi]

Authors

Silvia Chiusano

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Fulvio Corno

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Paolo Prinetto

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