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Test pattern decompression in parallel scan chain architecture

Martin Chloupek, Jiri Jenícek, Ondrej Novák, Martin Rozkovec. Test pattern decompression in parallel scan chain architecture. In Lukás Sekanina, Görschwin Fey, Jaan Raik, Snorre Aunet, Richard Ruzicka, editors, 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013. pages 219-223, IEEE Computer Society, 2013. [doi]

Authors

Martin Chloupek

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Jiri Jenícek

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Ondrej Novák

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Martin Rozkovec

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