Double patterning technology friendly detailed routing

Minsik Cho, Yongchan Ban, David Z. Pan. Double patterning technology friendly detailed routing. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 506-511, IEEE, 2008. [doi]

Authors

Minsik Cho

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Yongchan Ban

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David Z. Pan

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