Kwang J. Cho, Joon H. Han. Classification of complex patterns for surface inspection. In Proceedings of the 1991 IEEE International Conference on Robotics and Automation, Sacramento, CA, USA, 9-11 April 1991. pages 1802-1807, IEEE, 1991. [doi]
@inproceedings{ChoH91-0, title = {Classification of complex patterns for surface inspection}, author = {Kwang J. Cho and Joon H. Han}, year = {1991}, doi = {10.1109/ROBOT.1991.131885}, url = {https://doi.org/10.1109/ROBOT.1991.131885}, researchr = {https://researchr.org/publication/ChoH91-0}, cites = {0}, citedby = {0}, pages = {1802-1807}, booktitle = {Proceedings of the 1991 IEEE International Conference on Robotics and Automation, Sacramento, CA, USA, 9-11 April 1991}, publisher = {IEEE}, isbn = {0-8186-2163-X}, }