Jaehyun Cho, Sungwook Jung, Kyungsoo Jang, Hyungsik Park, Jongkyu Heo, Wonbaek Lee, DaeYoung Gong, Seungman Park, Hyungwook Choi, Hanwook Jung, Byoungdeog Choi, Junsin Yi. The effect of gate overlap lightly doped drains on low temperature poly-Si thin film transistors. Microelectronics Reliability, 52(1):137-140, 2012. [doi]
Abstract is missing.