A system-on-chip solution for deep learning-based automatic fetal biometric measurement

Hyunwoo Cho, Dongju Kim, Sunyeob Chang, Jinbum Kang, Yangmo Yoo. A system-on-chip solution for deep learning-based automatic fetal biometric measurement. Expert Syst. Appl., 237(Part B):121482, March 2024. [doi]

Abstract

Abstract is missing.