A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology - researchr publication authors

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Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski. A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 699-702, IEEE Computer Society, 2007. [doi]

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