Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski. A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 699-702, IEEE Computer Society, 2007. [doi]
@inproceedings{ChoKKPLCT07,
title = {A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology},
author = {Choongyeun Cho and Daeik D. Kim and Jonghae Kim and Jean-Olivier Plouchart and Daihyun Lim and Sangyeun Cho and Robert Trzcinski},
year = {2007},
doi = {10.1109/ISQED.2007.8},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.8},
tags = {data-flow, systematic-approach},
researchr = {https://researchr.org/publication/ChoKKPLCT07},
cites = {0},
citedby = {0},
pages = {699-702},
booktitle = {8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2795-6},
}