Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma

Chul-Hee Cho, Si-Jun Kim, Young Seok Lee, Won-nyoung Jeong, In-Ho Seong, Jang Jae Lee, Minsu Choi, Ye-Bin You, Sang Ho Lee, Jinho Lee, Shin-Jae You. Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma. Sensors, 22(17):6589, 2022. [doi]

Authors

Chul-Hee Cho

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Si-Jun Kim

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Young Seok Lee

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Won-nyoung Jeong

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In-Ho Seong

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Jang Jae Lee

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Minsu Choi

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Ye-Bin You

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Sang Ho Lee

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Jinho Lee

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Shin-Jae You

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