Chul-Hee Cho, Si-Jun Kim, Young Seok Lee, Won-nyoung Jeong, In-Ho Seong, Jang Jae Lee, Minsu Choi, Ye-Bin You, Sang Ho Lee, Jinho Lee, Shin-Jae You. Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma. Sensors, 22(17):6589, 2022. [doi]
Abstract is missing.