Eunjong Choi, Norihiro Fuke, Yuji Fujiwara, Norihiro Yoshida, Katsuro Inoue. Investigating the Generalizability of Deep Learning-based Clone Detectors. In 31st IEEE/ACM International Conference on Program Comprehension, ICPC 2023, Melbourne, Australia, May 15-16, 2023. pages 181-185, IEEE, 2023. [doi]
Abstract is missing.