Hyun Choi, Donghoon Han, Abhijit Chatterjee. Enhanced Resolution Jitter Testing Using Jitter Expansion. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 104-109, IEEE Computer Society, 2007. [doi]
@inproceedings{ChoiHC07,
title = {Enhanced Resolution Jitter Testing Using Jitter Expansion},
author = {Hyun Choi and Donghoon Han and Abhijit Chatterjee},
year = {2007},
doi = {10.1109/VTS.2007.31},
url = {http://dx.doi.org/10.1109/VTS.2007.31},
tags = {testing},
researchr = {https://researchr.org/publication/ChoiHC07},
cites = {0},
citedby = {0},
pages = {104-109},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}