Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr: HfO2 Ferroelectric Capacitor - researchr publication authors

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Yejoo Choi, Changwoo Han, Jaemin Shin, Seungjun Moon, Jinhong Min, Hyeonjung Park, Deokjoon Eom, Jehoon Lee, Changhwan Shin. Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr: HfO2 Ferroelectric Capacitor. Sensors, 22(11):4087, 2022. [doi]

This author has not been identified. Look up 'Yejoo Choi' in GoogleThis author has not been identified. Look up 'Changwoo Han' in GoogleThis author has not been identified. Look up 'Jaemin Shin' in GoogleThis author has not been identified. Look up 'Seungjun Moon' in GoogleThis author has not been identified. Look up 'Jinhong Min' in GoogleThis author has not been identified. Look up 'Hyeonjung Park' in GoogleThis author has not been identified. Look up 'Deokjoon Eom' in GoogleThis author has not been identified. Look up 'Jehoon Lee' in GoogleThis author has not been identified. Look up 'Changhwan Shin' in Google

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