Yejoo Choi, Changwoo Han, Jaemin Shin, Seungjun Moon, Jinhong Min, Hyeonjung Park, Deokjoon Eom, Jehoon Lee, Changhwan Shin. Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr: HfO2 Ferroelectric Capacitor. Sensors, 22(11):4087, 2022. [doi]
@article{ChoiHSMMPELS22,
title = {Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr: HfO2 Ferroelectric Capacitor},
author = {Yejoo Choi and Changwoo Han and Jaemin Shin and Seungjun Moon and Jinhong Min and Hyeonjung Park and Deokjoon Eom and Jehoon Lee and Changhwan Shin},
year = {2022},
doi = {10.3390/s22114087},
url = {https://doi.org/10.3390/s22114087},
researchr = {https://researchr.org/publication/ChoiHSMMPELS22},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {22},
number = {11},
pages = {4087},
}