Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong-Tae Park. Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. Microelectronics Reliability, 54(9-10):2325-2328, 2014. [doi]