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Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs

Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong-Tae Park. Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. Microelectronics Reliability, 54(9-10):2325-2328, 2014. [doi]

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