Sunghoon Choi, You-Chul Shin, Jun Heo, Kihyoung Cho, Minseok Oh. Effective Puncturing Schemes for Block-type Low-Density Parity-Check Codes. In Proceedings of the 65th IEEE Vehicular Technology Conference, VTC Spring 2007, 22-25 April 2007, Dublin, Ireland. pages 1841-1845, IEEE, 2007. [doi]
@inproceedings{ChoiSHCO07,
title = {Effective Puncturing Schemes for Block-type Low-Density Parity-Check Codes},
author = {Sunghoon Choi and You-Chul Shin and Jun Heo and Kihyoung Cho and Minseok Oh},
year = {2007},
doi = {10.1109/VETECS.2007.382},
url = {http://dx.doi.org/10.1109/VETECS.2007.382},
tags = {type checking},
researchr = {https://researchr.org/publication/ChoiSHCO07},
cites = {0},
citedby = {0},
pages = {1841-1845},
booktitle = {Proceedings of the 65th IEEE Vehicular Technology Conference, VTC Spring 2007, 22-25 April 2007, Dublin, Ireland},
publisher = {IEEE},
}