Sunghoon Choi, You-Chul Shin, Jun Heo, Kihyoung Cho, Minseok Oh. Effective Puncturing Schemes for Block-type Low-Density Parity-Check Codes. In Proceedings of the 65th IEEE Vehicular Technology Conference, VTC Spring 2007, 22-25 April 2007, Dublin, Ireland. pages 1841-1845, IEEE, 2007. [doi]
Abstract is missing.