Testing Inter-Word Coupling Faults of Wide I/O DRAMs

Che-Wei Chou, Yong-Xiao Chen, Jin-Fu Li. Testing Inter-Word Coupling Faults of Wide I/O DRAMs. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 67-72, IEEE, 2015. [doi]

Authors

Che-Wei Chou

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Yong-Xiao Chen

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Jin-Fu Li

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