Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques - researchr publication authors

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Mihir R. Choudhury, Quming Zhou, Kartik Mohanram. Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 204-209, ACM, 2006. [doi]

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