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Aging Analysis of Low Dropout Regulator for Universal Recycled IC Detection

Sreeja Chowdhury, Hao-Ting Shen, Beomsoo Park, Nima Maghari, Domenic Forte. Aging Analysis of Low Dropout Regulator for Universal Recycled IC Detection. In 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, FL, USA, July 15-17, 2019. pages 604-609, IEEE, 2019. [doi]

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Sreeja Chowdhury

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Hao-Ting Shen

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Beomsoo Park

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Nima Maghari

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Domenic Forte

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