Kyriakos Christou, Maria K. Michael, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda. A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 389-394, IEEE Computer Society, 2008. [doi]
Abstract is missing.